Stefan Rakel, M.Sc. RWTH

Wissenschaftlicher Mitarbeiter

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rakel[at]embedded[dot]rwth-aachen[dot]de

Tel. +49 241 80 21165
Fax +49 241 80 22150

Adresse: Ahornstr. 55, 52074 Aachen, Germany
Büro: Raum 2322 (Gebäude H)

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Publikationen


Publikations-Export
[TRR+18a]
PDFBIB
Thönnessen, D., Reinker, N., Rakel, S., Svetlakov, A., and Kowalewski, S., "Correctness Properties and Exemplified Applicability of a Signal Matching Algorithm with Multidimensional Tolerance Specifications", in Proc. 14th IEEE International Conference on Automation Science and Engineering (CASE), 2018, IEEE, pp. 1-6, To appear.

Correctness Properties and Exemplified Applicability of a Signal Matching Algorithm with Multidimensional Tolerance Specifications

Bibtex entry :

@inproceedings { TRR+18a,
	author = { Th{\"o}nnessen, David and Reinker, Niklas and Rakel, Stefan
		and Svetlakov, Andrei and Kowalewski, Stefan },
	title = { Correctness Properties and Exemplified Applicability of a
		Signal Matching Algorithm with Multidimensional Tolerance
		Specifications },
	booktitle = { 14th IEEE International Conference on Automation Science and
		Engineering (CASE) },
	publisher = { IEEE },
	publishedas = { Online },
	language = { eng },
	pages = { 1--6 },
	year = { 2018 },
	timestamp = { 2018.05.18 },
	i11key = { conference },
	i11projectkey = { hil },
	note = { To appear },
	for_reporting_period = { 2018 },
}
[TRRK18]
Thönnessen, D., Rakel, S., Reinker, N., and Kowalewski, S., "Matching Discrete Signals for Hardware-in-the-Loop-Testing of PLCs", in Proc. 3rd IFAC Conference on Embedded Systems, Computational Intelligence and Telematics in Control (CESCIT), 2018, vol. 51, IFAC, pp. 229-234.

Matching Discrete Signals for Hardware-in-the-Loop-Testing of PLCs

Bibtex entry :

@inproceedings { TRRK18,
	author = { Th{\"o}nnessen, David and Rakel, Stefan and Reinker, Niklas
		and Kowalewski, Stefan },
	title = { Matching Discrete Signals for Hardware-in-the-Loop-Testing
		of PLCs },
	booktitle = { 3rd IFAC Conference on Embedded Systems, Computational
		Intelligence and Telematics in Control (CESCIT) },
	volume = { 51 },
	publisher = { IFAC },
	publishedas = { Online },
	issn = { 2405-8963 },
	language = { eng },
	pages = { 229--234 },
	year = { 2018 },
	timestamp = { 2018.03.27 },
	i11key = { conference },
	i11projectkey = { hil },
	url = { https://www.sciencedirect.com/science/article/pii/S2405896318305883/pdf?md5=63ab3b92a7129a371a4496620ae493be&pid=1-s2.0-S2405896318305883-main.pdf },
	for_reporting_period = { 2018 },
}
[TRRK17]
Thönnessen, D., Reinker, N., Rakel, S., and Kowalewski, S., "A Concept for PLC Hardware-in-the-loop Testing Using an Extension of Structured Text", in Proc. 22nd IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2017, IEEE, pp. 66-74.

A Concept for PLC Hardware-in-the-loop Testing Using an Extension of Structured Text

Bibtex entry :

@inproceedings { TRRK17,
	author = { Th{\"o}nnessen, David and Reinker, Niklas and Rakel, Stefan
		and Kowalewski, Stefan },
	title = { A Concept for PLC Hardware-in-the-loop Testing Using an
		Extension of Structured Text },
	booktitle = { 22nd IEEE International Conference on Emerging Technologies
		and Factory Automation (ETFA) },
	publisher = { IEEE },
	publishedas = { Online },
	isbn = { 978-1-5090-6505-9 },
	issn = { 1946-0759 },
	language = { eng },
	pages = { 66--74 },
	year = { 2017 },
	timestamp = { 2017.06.19 },
	i11key = { conference },
	i11projectkey = { hil },
	url = { http://ieeexplore.ieee.org/document/8247580/ },
	for_reporting_period = { 2017 },
}

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